Infrared and Laser Engineering, Volume. 44, Issue 6, 1733(2015)

Applications of ASIC in the long array column of infrared TDI detector

Han Bing1,2, Chen Xin1,2, Rao Peng1,2, Lin Changqing1,2, Sun Shengli1,2, and Li Lufang1,2
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  • 1[in Chinese]
  • 2[in Chinese]
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    There always exist some challenges in long array column infrared Time Delay Integration(TDI) detecting system, such as large number of channels, high noise and power dissipation. To solve those problems mentioned above, a new solution was proposed to improve the performance of infrared TDI detecting system with Application Specific Integrated Circuit(ASIC) chip(eight-channel signal conditioning chip). Meanwhile, it helped to light the weight and reduce the system volume. In the system, the noise and dissipation both reduced to half than before. The average noise of system was 1.42 mV with power of 0.73 W. More higher integration was achieved by Readout Integrated Circuit(ROIC), design complexity and workload were reduced. It provides technical support and practical foundation for micro miniaturization aerospace remote sensing satellite development.

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    Han Bing, Chen Xin, Rao Peng, Lin Changqing, Sun Shengli, Li Lufang. Applications of ASIC in the long array column of infrared TDI detector[J]. Infrared and Laser Engineering, 2015, 44(6): 1733

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    Paper Information

    Category: 红外技术及应用

    Received: Oct. 7, 2014

    Accepted: Nov. 17, 2014

    Published Online: Jan. 26, 2016

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