Frontiers of Optoelectronics, Volume. 5, Issue 3, 292(2012)
Research on VOx uncooled infrared bolometer based on porous silicon
In this paper, vanadium oxide thin film of TCR of - 3.5%/K has been deposited by pulsed DC magnetron sputtering method. The property of this VOx has been investigated by X-ray diffractometer (XRD) and atomic force microscopy (AFM) in detail. XRD test indicates that this film is composed of V2O3, V3O5 and VO2.VOx microbolometer with infrared (IR) absorbing structure is fabricated based on porous silicon sacrificial layer technology. Optimized micro-bridge structure is designed and carried out to decrease thermal conductance and this structure shows good compatibility with micromachining technology. This kind of bolometer with 74% IR absorption of 8-14 μm, has maximum detectivity of 1.09×109 cm$Hz1/2/W at 24 Hz frequency and 9.8 μA bias current.
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Bin WANG, Jianjun LAI, Erjing ZHAO, Haoming HU, Sihai CHEN. Research on VOx uncooled infrared bolometer based on porous silicon[J]. Frontiers of Optoelectronics, 2012, 5(3): 292
Received: Oct. 26, 2011
Accepted: May. 8, 2012
Published Online: Oct. 12, 2012
The Author Email: LAI Jianjun (jjlai@mail.hust.edu.cn)