Journal of Infrared and Millimeter Waves, Volume. 44, Issue 2, 148(2025)
Study on the preparation and spectroscopic ellipsometry of MoTe2 quantum dot films
The preparation of quantum dot thin films and the accurate measurement of optical constants are particularly important for the development and application of quantum dot devices in optoelectronic fields. At present, the optical constants of MoTe2 single-crystal films prepared by mechanical exfoliation and chemical vapor deposition are relatively mature. However, the optical constants of 2H-MoTe2 quantum dot films are rarely reported.In this work, 2H-MoTe2 quantum dots were prepared by ultrasonic assisted liquid phase exfoliation, and of 2H-MoTe2 quantum dots with two sizes were acquired via adjusting the type of solvent and the order of ultrasonic process. The optical constants such as refractive index, extinction coefficient and dielectric constant of quantum dot films of two sizes were studied by B-spline model and Tauc-Lorentz model using ellipsometry. The results demonstrate that the 2H-MoTe2 quantum dots with two sizes have similar refractive index, extinction coefficient and a wider spectral absorption in the visible to near infrared band. And compared with MoTe2 bulk material, 2H-MoTe, quantom dots have a lower dielectric constant.
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Guo-Bin LI, Kun HU, Tai-Wei ZHANG, Ao YANG, Yi-Ping XIA, Xue-Ming LI, Li-Bin TANG, Pei-Zhi YANG, Shan-Li WANG, Sheng-Di CHEN, Li YANG, Yan ZHANG. Study on the preparation and spectroscopic ellipsometry of MoTe2 quantum dot films[J]. Journal of Infrared and Millimeter Waves, 2025, 44(2): 148
Category: Infrared Physics, Materials and Devices
Received: Aug. 12, 2024
Accepted: --
Published Online: Mar. 14, 2025
The Author Email: LI Xue-Ming (lxmscience@163.com), TANG Li-Bin (scitang@163.com)