Acta Optica Sinica, Volume. 9, Issue 7, 630(1989)
Measurement of bulk and interface absorption in Multilayer coatings
By an appropriate variation in the thickness of the high and low refracting components, a the bulk and interface absorption of dielectric TiO2/SiO2 multilayer stacks was investigated using transverse photothermal deflection technique. The results are in good agreement with those previously reported using photoacoustio method.
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WU ZHOULING, FAN ZHONGXIU. Measurement of bulk and interface absorption in Multilayer coatings[J]. Acta Optica Sinica, 1989, 9(7): 630