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Chinese Journal of Lasers, Volume. 17, Issue 2, 111(1990)

Laser-induced mark formation on phase change thin film

[in Chinese], [in Chinese], and [in Chinese]
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    Based upon TEM analysis, phase change storage mechanism of TeSeln thin film has been studied in detail and a model for writing and erasing process is proposed.

    Keywords
    recording markphase change thin film
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    [in Chinese], [in Chinese], [in Chinese]. Laser-induced mark formation on phase change thin film[J]. Chinese Journal of Lasers, 1990, 17(2): 111

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    Paper Information

    Category: holography and information processing

    Received: Apr. 1, 1989

    Accepted: --

    Published Online: Nov. 12, 2007

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology