Laser & Optoelectronics Progress, Volume. 59, Issue 23, 2312004(2022)

Simulation and Error Analysis of Involute Reflector Optical Delay Line

Yinjie Xin1,2, Quanyong Li1,2、*, Wei Sun2, Qishu Wang1,2, and Wenbo Wang1,2
Author Affiliations
  • 1Key Laboratory of Photoelectric Measurement and Optical Information Transmission Technology of Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin, China
  • 2School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin, China
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    As an emerging coherent detection technology, terahertz time domain spectroscopy (THz-TDS) technology has promoted the progress and innovation of safety testing and nondestructive testing technologies, and has made outstanding contributions to the protection of people's life and health and property safety. In order to obtain better imaging results and detection sensitivity, it is necessary to increase the detection speed of terahertz signals while ensuring that the signal-to-noise ratio of the acquired signal meets the requirements. Based on the involute reflector optical delay line device, this paper analyzes the optical delay line shape parameters, and simulates a model with a delay distance of 71 mm and a delay time of 236.7 ps. The error analysis is made in three aspects: the eccentric error of the axis of the rotating mirror, the installation error of the planar mirror, and the outgoing spot distortion of the rotating optical delay line, and the method of reducing the error is discussed. It provides a theoretical and simulation basis for the device to increase the time delay, obtain a more complete terahertz spectrum, and further improve the performance of the THz-TDS system.

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    Yinjie Xin, Quanyong Li, Wei Sun, Qishu Wang, Wenbo Wang. Simulation and Error Analysis of Involute Reflector Optical Delay Line[J]. Laser & Optoelectronics Progress, 2022, 59(23): 2312004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 17, 2022

    Accepted: Jun. 13, 2022

    Published Online: Nov. 28, 2022

    The Author Email: Li Quanyong (liquanyong@cust.edu.cn)

    DOI:10.3788/LOP202259.2312004

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