Aerospace integrated circuits represent core components of space electronic systems, and anti-radiation hardening is a key technology to ensure the reliable operation of aerospace integrated circuits in the space domain. As the feature sizes of integrated circuits shrink to the nanometer scale, the single-event effect gradually becomes the most critical factor limiting the radiation-hardened performance level of aerospace integrated circuits. In this study, radiation hardened by design is utilized as a method to develop radiation-hardened performance. Based on single-event radiation tests on a heavy ion accelerator, new methods are proposed for the single-event test evaluation of new processes and devices. Consequently, new technique development and radiation effect law research are also undertaken. The effectiveness of the design hardening technology is evaluated, and a single-event radiation damage mechanism is discovered. The proposed technology provides key support for the production of high-reliability and long-lifetime aerospace integrated circuit products.