Acta Optica Sinica, Volume. 40, Issue 23, 2312006(2020)

Method for Fast Detection of Infrared Targets Based on Key Points

Zhuang Miao1,2, Yong Zhang1、*, Ruimin Chen1,2, and Weihua Li1,2
Author Affiliations
  • 1Key Laboratory of Infrared System Detection and Imaging Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2School of Electronic, Electrical, and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • show less

    Aim

    ing at the real-time request of the infrared detection system for target detection, we propose a method for fast detection of infrared targets based on key points. Taking the target center as the key point of target detection, we first design a lightweight feature extraction network. Then, we design a corresponding feature fusion network using the spatial and semantic information of features at different levels combined with the characteristics of small infrared targets. Finally, the prediction of target category, location and size is realized. The model is comparatively tested on the self-built aerial infrared target dataset. Compared with the classic detection models such as YOLOv3, the detection speed is greatly improved and the detection accuracy is only slightly reduced. Compared with the same type of fast detection model, Tiny-YOLOv3, the detection accuracy increases by 8.9% and the detection speed running on the central processing unit (CPU)increases by 13.9 ms/frame under the condition that the model size is compressed to 23.39% of Tiny-YOLOv3's size. The detection performance is significantly improved and the effectiveness of the method is confirmed.

    Tools

    Get Citation

    Copy Citation Text

    Zhuang Miao, Yong Zhang, Ruimin Chen, Weihua Li. Method for Fast Detection of Infrared Targets Based on Key Points[J]. Acta Optica Sinica, 2020, 40(23): 2312006

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 17, 2020

    Accepted: Sep. 8, 2020

    Published Online: Nov. 23, 2020

    The Author Email: Zhang Yong (zybxy@sina.com)

    DOI:10.3788/AOS202040.2312006

    Topics