Acta Optica Sinica, Volume. 35, Issue 4, 430002(2015)

Spatial Resolution Measurement of Synchrotron Radiation Infrared Microspectroscopy Beamline

Zhu Huachun*, Tong Yajun, Ji Te, Peng Weiwei, Zhang Zengyan, Chen Min, and Xiao Tiqiao
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    Infrared synchrotron radiation provides considerable brightness advantages over conventional infrared sources in a wide wavelength range, allowing the spatial resolution to reach the diffraction limit. Spatial resolution of BL01B1 infrared microspectroscopy beamline station in Shanghai Synchrotron Radiation Facility (SSRF) is tested. Step-edge method and resolution target bar method are used to measure the spatial resolution of the infrared microspectroscopy beamline BL01B1. The experimental results show that the spatial resolution of this infrared microspectroscopy beamline station and the diffraction limit theory are comparable in the middle infrared region.

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    Zhu Huachun, Tong Yajun, Ji Te, Peng Weiwei, Zhang Zengyan, Chen Min, Xiao Tiqiao. Spatial Resolution Measurement of Synchrotron Radiation Infrared Microspectroscopy Beamline[J]. Acta Optica Sinica, 2015, 35(4): 430002

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    Paper Information

    Category: Spectroscopy

    Received: Oct. 29, 2014

    Accepted: --

    Published Online: Apr. 3, 2015

    The Author Email: Huachun Zhu (zhuhuachun@sinap.ac.cn)

    DOI:10.3788/aos201535.0430002

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