Chinese Journal of Lasers, Volume. 17, Issue s1, 162(1990)
Measurement of absorption distribution on optical thin film by scanning photothermal microscopy
A scanning photothermal microscopy based on photothermal deflection spectroscopy is used to measure the absorption distribution of laser damaged films. Its detecting sensitivity and detecting accuracy is 2.5×10-6 and 18% respectively.
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Huang Xuebo, Chen Wenbin. Measurement of absorption distribution on optical thin film by scanning photothermal microscopy[J]. Chinese Journal of Lasers, 1990, 17(s1): 162
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