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Acta Optica Sinica, Volume. 10, Issue 7, 587(1990)

Identification of X-ray spectral lines in high-charged laser-producde Ge plasma

[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    With the calculated oscillator strengths of Na-, Ne-, F- and O- like Ge ions, over forty lines (λ= 6-10A) of laser-produced Ge plasma taken by a plate crystal spectrograph have been identified.

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    oscillator strenthX-ray spectral lines of laser plasma
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Identification of X-ray spectral lines in high-charged laser-producde Ge plasma[J]. Acta Optica Sinica, 1990, 10(7): 587

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Dec. 15, 1989

    Accepted: --

    Published Online: Nov. 12, 2007

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology