Acta Optica Sinica, Volume. 39, Issue 7, 0712008(2019)

Measurement of High-Order Coherence of Light Field Based on Intensified Charge-Coupled Device

Jinkai Cao, Pengfei Yang, Yali Tian, Wei Wu, Pengfei Zhang, Gang Li*, and Tiancai Zhang**
Author Affiliations
  • Collaborative Innovation Center of Extreme Optics, State Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Opto-Electronics, Shanxi University, Taiyuan, Shanxi 030006, China
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    The high-order correlation characteristics of a light field are important features for revealing the statistical behavior of light. When the traditional HBT(Hanbury-Brown and Twiss) experimental model is used to measure the multi-photon high-order correlation, the measurement is complicated because of the limited number of single-photon detectors and splitters. In this study, we propose a fast method to measure the high-order correlation of a light field using an intensified charge-coupled device. The high-order coherence of the pseudothermal and coherent light fields can be measured and analyzed by varying the exposure time and light intensity (counting rate). The results demonstrate that the high-order coherence of a light field can be determined under appropriate conditions. When the exposure time is approximately 600 ns and the counting rate is 5.12×10 8 s -1, the measured second-order and third-order coherences of the pseudothermal light fields are g(2)T(0)=1.79±0.20 and g(3)T(0)=4.94±0.59, respectively. Note that the coherence of up to four orders has been measured and that the results can be theoretically explained. We expect that this method can be applied for measuring and studying the high-order coherence of some light sources. Furthermore, we believe that the proposed method will significantly contribute to revealing the high-order correlations of the light fields.

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    Jinkai Cao, Pengfei Yang, Yali Tian, Wei Wu, Pengfei Zhang, Gang Li, Tiancai Zhang. Measurement of High-Order Coherence of Light Field Based on Intensified Charge-Coupled Device[J]. Acta Optica Sinica, 2019, 39(7): 0712008

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 17, 2019

    Accepted: Apr. 1, 2019

    Published Online: Jul. 16, 2019

    The Author Email: Li Gang (gangli@sxu.edu.cn), Zhang Tiancai (tczhang@sxu.edu.cn)

    DOI:10.3788/AOS201939.0712008

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