Laser & Optoelectronics Progress, Volume. 56, Issue 12, 121002(2019)

USM Sharpening Image Detection Based on Local Binary Pattern Method

Yongzhi Quan, Shuhui Gao*, Mengjing Yang, Xiaojia Jiang, and Xinlong He
Author Affiliations
  • School of Forensic Science, People's Public Security University of China, Beijing 100038, China
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    Herein, a method for unsharp masking (USM) sharpening detection is proposed. First, the local binary pattern (LBP) method is used to detect the edge features in an image. Then, a support vector machine is used for classification to detect whether the image is sharpened. Subsequently, the different LBP detection modes are compared in terms of the resulting sharpening intensity to select the optimal detection method. The experimental results show that the LBP method can achieve a relatively good USM sharpening detection effect. The rotation-invariant mode provides the best detection performance, providing a detection rate of up to 90% under the condition of weak sharpening, which is better than those achieved by the existing methods.

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    Yongzhi Quan, Shuhui Gao, Mengjing Yang, Xiaojia Jiang, Xinlong He. USM Sharpening Image Detection Based on Local Binary Pattern Method[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121002

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    Paper Information

    Category: Image Processing

    Received: Nov. 26, 2018

    Accepted: Jan. 10, 2019

    Published Online: Jun. 13, 2019

    The Author Email: Gao Shuhui (gaoshuhui@ppsuc.edu.cn)

    DOI:10.3788/LOP56.121002

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