The rigorous coupled wave analysis is used to analyze the spatial spectrums filtering of light coupling in the metal-dielectric multilayer metamaterials. The band pass window and transmission amplitude of spatial spectrums in the Al/MgF2 metamaterials are carefully investigated for different unit thickness, filling ratio, film loss and pairs of Al/MgF2 multilayers. It is demonstrated that the band pass window is mainly determined by the unite thickness and filling ratio, while the transmission amplitude is mainly determined by the imaginary loss and pairs of film materials. This research has potential application in the superresolution imaging lithography, surface plamons structured illumination, ultrathin surface microscopy and bio sensing etc.