High Power Laser and Particle Beams, Volume. 32, Issue 7, 073002(2020)

Research on several test issues of electromagnetic radiation susceptibility for electronic equipment

Xiaodong Pan... Guanghui Wei, Haojiang Wan, Xinfu Lu and Kai Zhao |Show fewer author(s)
Author Affiliations
  • National Key Laboratory of Science and Technology on Electromagnetic Environment Effects, Shijiazhuang Campus, Army Engineering University, Shijiazhuang 050003, China
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    According to the practical problem that some electronic equipments still exist electromagnetic incompatibility phenomenon in training and fighting stage after passing the normal electromagnetic compatibility test required by National Military Standard of China, on the basis of systematically analyzing the technical requirements and test methods in the current military standard, considering the technology accumulation of our research team on the electronic information equipment electromagnetic environment effects in recent years, the influence the several conditions on the electronic information equipment electromagnetic radiation susceptibility test results were discussed. These conditions contain not searching the sensitive receiving direction of the equipment under test(EUT), lacking of electromagnetic radiation susceptibility test in in-band frequency, multi-source radiation causing remarkable reduction of the susceptibility threshold of the EUT and so on. On the basis of the discussion, the measures and suggestions which can solve the above related problems were given. The development tendency of the high intensity electromagnetic radiation effect test technology and the complex electromagnetic environment adaptability evaluation technology for electronic equipment were discussed.

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    Xiaodong Pan, Guanghui Wei, Haojiang Wan, Xinfu Lu, Kai Zhao. Research on several test issues of electromagnetic radiation susceptibility for electronic equipment[J]. High Power Laser and Particle Beams, 2020, 32(7): 073002

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    Paper Information

    Category: High Power Microwave Technology

    Received: Apr. 9, 2020

    Accepted: --

    Published Online: Jul. 10, 2020

    The Author Email:

    DOI:10.11884/HPLPB202032.200088

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