Frontiers of Optoelectronics, Volume. 4, Issue 4, 378(2011)
Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure
Silicon nanowires (SiNWs) with tens of micrometer in length have been synthesized and modified with Ag nanoparticles, which were confirmed by X-ray diffractometer (XRD), scanning electron microscopy and transmission electron microscopy. The Ag/Si nanostructure was employed to detect inorganic ions SO2-4 via surface-enhanced Raman scattering (SERS) with strong signals at low concentrations of 110-9 mol/L. This ultrasensitive method might be applied in other fields.
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Yueyin SHAO, Yongqian WEI, Zhenghua WANG. Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure[J]. Frontiers of Optoelectronics, 2011, 4(4): 378
Received: May. 16, 2011
Accepted: Jul. 12, 2011
Published Online: Sep. 21, 2012
The Author Email: SHAO Yueyin (yyshao@suda.edu.cn)