Frontiers of Optoelectronics, Volume. 4, Issue 4, 378(2011)

Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure

Yueyin SHAO1、*, Yongqian WEI1, and Zhenghua WANG2
Author Affiliations
  • 1Laboratory Material Supply Centre, Soochow University, Suzhou 215123, China
  • 2Anhui Key Laboratory of Functional Molecular Solids, College of Chemistry and Materials Science, Anhui Normal University, Wuhu 241000, China
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    Silicon nanowires (SiNWs) with tens of micrometer in length have been synthesized and modified with Ag nanoparticles, which were confirmed by X-ray diffractometer (XRD), scanning electron microscopy and transmission electron microscopy. The Ag/Si nanostructure was employed to detect inorganic ions SO2-4 via surface-enhanced Raman scattering (SERS) with strong signals at low concentrations of 110-9 mol/L. This ultrasensitive method might be applied in other fields.

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    Yueyin SHAO, Yongqian WEI, Zhenghua WANG. Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure[J]. Frontiers of Optoelectronics, 2011, 4(4): 378

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    Paper Information

    Received: May. 16, 2011

    Accepted: Jul. 12, 2011

    Published Online: Sep. 21, 2012

    The Author Email: SHAO Yueyin (yyshao@suda.edu.cn)

    DOI:10.1007/s12200-011-0171-8

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