Laser & Optoelectronics Progress, Volume. 50, Issue 3, 31602(2013)

Defect Detection and Classification Evaluation System for Crystalline Silicon Solar Cells

Wang Xuemeng1、*, Ye Zirui2, Shen Hui1,2, Liang Jingqiang1, and Yin Haoping2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    About 5000 pieces of low-efficiency defective crystalline silicon (C-Si) solar cells are collected, inspected and analyzed, and a defect inspection and classification evaluation system for C-Si solar cells is established. The system which includes current-voltage (I-V) test, thermal imaging test, electroluminescence imaging test etc., can identify 16 kinds of defects. The system can give out detailed description and evaluation of these defects following the steps of "defect definition, testing feature, influience on performance, original mechanism, preventive action, value of repairing". The result will be helpful in improving C-Si solar cell production and repairing defective cells.

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    Wang Xuemeng, Ye Zirui, Shen Hui, Liang Jingqiang, Yin Haoping. Defect Detection and Classification Evaluation System for Crystalline Silicon Solar Cells[J]. Laser & Optoelectronics Progress, 2013, 50(3): 31602

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    Paper Information

    Category: Materials

    Received: Oct. 8, 2012

    Accepted: --

    Published Online: Feb. 1, 2013

    The Author Email: Xuemeng Wang (wxmcom@126.com)

    DOI:10.3788/lop50.031602

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