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Journal of Advanced Dielectrics, Volume. 14, Issue 3, 2440005(2024)

Microstructure of electronic-grade polycrystalline silicon core-matrix interface

Bochen Lu1... Yuxuan Yang1, Yang Zhang1,3,*, Rong Qin2, Xinlu Xue2,**, Jinyue Peng1 and Haijun Wu1,*** |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory for Mechanical Behavior of Materials, Electronic Materials Research Laboratory (Key Lab of Education Ministry) and School of Electronic and Information Engineering, Xi’an Jiaotong University, 710049, Xi’an, P. R. China
  • 2Qinghai Xince Technology Co., Ltd., Huanghe Hydropower Development Co., Ltd., 810007, Xining, P. R. China
  • 3Instrumental Analysis Center, Xi’an Jiaotong University, Xi’an, P. R. China
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    Bochen Lu, Yuxuan Yang, Yang Zhang, Rong Qin, Xinlu Xue, Jinyue Peng, Haijun Wu. Microstructure of electronic-grade polycrystalline silicon core-matrix interface[J]. Journal of Advanced Dielectrics, 2024, 14(3): 2440005

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    Paper Information

    Category: Research Articles

    Received: Jan. 3, 2024

    Accepted: Jan. 24, 2024

    Published Online: Jul. 22, 2024

    The Author Email: Zhang Yang (zhangyang2020@xjtu.edu.cn), Xue Xinlu (xuexinlu@spic.com.cn), Wu Haijun (wuhaijunnavy@xjtu.edu.cn)

    DOI:10.1142/S2010135X24400058

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology