Acta Photonica Sinica, Volume. 39, Issue s1, 14(2010)
Progress in Measurement with Picometer Resolution and Subdivision Technique
The domestic and foreign progress of picometer resolution measurements were reviewed. Typtical methods for measurement with high resolution(picometer resolution) were introduced, and the progress of picometer measurements was presented. The principles and corresponding subdivision techiniques were studied.Then, two novel measurements were proposed and analyzed. The multiple reflection interferometer was analyzed. It has the advantages of higher resoultion and more simplicity deivce than X-ray interferometer, which provide a good future in the fields of spectroscopy and high-precision measurement.
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TANG Shan-zhi, WANG Zhao, JIANG Zhi-xiong, GUO Jun-jie. Progress in Measurement with Picometer Resolution and Subdivision Technique[J]. Acta Photonica Sinica, 2010, 39(s1): 14
Received: Jul. 12, 2010
Accepted: --
Published Online: May. 31, 2011
The Author Email: Shan-zhi TANG (tangshanzhi1984@163.com)