Laser & Optoelectronics Progress, Volume. 49, Issue 7, 70002(2012)
Developments of X-Ray Grating Imaging Based on Talbot Interferometry
We present a review of X-ray grating-based imaging based on interferometry, including the recent developments in instrumentation and methodology. The classic X-ray grating-based imaging based on Talbot-Lau interferometry is introduced in terms of its general principles and system configuration, as well as the multiple information (i.e., attenuation, refraction and small-angle scattering information) retrieval algorithms. Up-to-date analyses and optimizations of this method are presented, including approaches to relax the high positioning resolution requirement in phase stepping process and attempts on large-field-of-view imaging with high-resolution gratings. Secondly, we introduce the latest developments in two-dimensional grating-based imaging and time-resolved four-dimensional grating-based imaging. An outlook of X-ray grating-based imaging is given.
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Han Yueping, Chen Zhiqiang, Zhang Li, Huang Zhifeng, Zhang Ran, Jiang Xiaolei. Developments of X-Ray Grating Imaging Based on Talbot Interferometry[J]. Laser & Optoelectronics Progress, 2012, 49(7): 70002
Category: Reviews
Received: Dec. 29, 2011
Accepted: --
Published Online: May. 2, 2012
The Author Email: Yueping Han (yuepinghan@163.com)