Laser & Optoelectronics Progress, Volume. 58, Issue 12, 1210017(2021)

Phase Unwrapping Correction Method for Dual-Frequency Fringe Projection Profilometry

Lei Cheng1, Yanjuan Pan1, Dongdong Xi1, Yuwei Wang1,2, and Lu Liu1,2、*
Author Affiliations
  • 1School of Engineering, Anhui Agricultural University, Hefei, Anhui 230036, China
  • 2Anhui Province Engineering Laboratory of Intelligent Agricultural Machinery and Equipment, Hefei, Anhui 230036, China
  • show less

    Dual-frequency fringe projection method is a common phase unwrapping algorithm. Due to the influence of factors such as random noise and camera defocusing, the fringe order calculation results of the dual-frequency phase unwrapping algorithm often have errors, leading to phase errors. In order to solve this problem, this paper proposes a phase unwrapping correction algorithm to correct the high-frequency fringe orders. First, the entire fringe region is divided into two masks according to the value range of high-frequency truncated phase. Then, the connected components of these two masks are marked, respectively. In addition, the fringe orders that appear most frequently in each marked region are counted, whose values are assigned to all pixels in the current marked region. Finally, the absolute phase is obtained by unwrapping the corrected fringe orders. The simulation and actual experimental results show that the proposed method can be used to effectively eliminate the phase unwrapping errors in the dual-frequency fringe projection method.

    Tools

    Get Citation

    Copy Citation Text

    Lei Cheng, Yanjuan Pan, Dongdong Xi, Yuwei Wang, Lu Liu. Phase Unwrapping Correction Method for Dual-Frequency Fringe Projection Profilometry[J]. Laser & Optoelectronics Progress, 2021, 58(12): 1210017

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Image Processing

    Received: Sep. 10, 2020

    Accepted: Oct. 21, 2020

    Published Online: Jun. 18, 2021

    The Author Email: Liu Lu (vliulu@ahau.edu.cn)

    DOI:10.3788/LOP202158.1210017

    Topics