Chinese Journal of Quantum Electronics, Volume. 31, Issue 4, 489(2014)

Research progress in 4H-SiC-based ultraviolet photodetectors

Jia-fa CAI* and Zheng-yun WU
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  • [in Chinese]
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    Advances in 4H silicon carbide (4H-SiC) as a potential material for low-level ultraviolet (UV) radiation detection application at high-temperature, radiation hardened conditions are introduced. The latest progress in development of and the current state-of-art of different types of 4H-SiC-based UV photodetectors are reviewed. The approaches to improve the performances of the 4H-SiC-based photodetectors such as reducing the dark current and enhancing the photo responsivity are presented. The outlook for the development of 4H-SiC-based UV photodetectors are discussed.

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    CAI Jia-fa, WU Zheng-yun. Research progress in 4H-SiC-based ultraviolet photodetectors[J]. Chinese Journal of Quantum Electronics, 2014, 31(4): 489

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    Paper Information

    Received: Apr. 28, 2014

    Accepted: --

    Published Online: Jul. 30, 2014

    The Author Email: Jia-fa CAI (jfcai@xmu.edu.cn)

    DOI:10.3969/j.issn.1007-5461.2014.04.014

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