Laser & Optoelectronics Progress, Volume. 50, Issue 5, 51205(2013)
Highlight Removal Based on Frequency-Domain Filtering
Three-dimensional (3D) measurement technique of structured light is widely used in objects′ outline measurement. However, when it is applied to measure mechanical components and parts, some parts of intense reflection (highlight or specular light) on the surface of metal components would form highlight area. The intense reflected light can make CCD saturate and cause the extraction of center of light stripe inaccurate, and then errors would appear in the measurement results. Thus, it is a matter of great urgency to find a way to avoid highlight. We try to use the characteristic of structured light measurement system to propose a new method of highlight removal——frequency-domain filtering. Highlight is defined as a kind of noise, and this method compares the difference between highlight frequency spectrum and diffuse light frequency spectrum to make frequency filtering, and then to remove the influence of highlight. Simulating highlight in 3dsmax software, the proposed method can get 0.8 pixel improvement in the accuracy of light stripe extraction. Results of real blade test are also provided and prove that it is a better solution in actual blade test. Both simulation and experiment confirm that the proposed method could improve the accuracy in extraction of light stripe center.
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Chai Yuting, Wang Zhao, Gao Jianmin, Huang Junhui. Highlight Removal Based on Frequency-Domain Filtering[J]. Laser & Optoelectronics Progress, 2013, 50(5): 51205
Category: Instrumentation, Measurement and Metrology
Received: Jan. 14, 2013
Accepted: --
Published Online: May. 7, 2013
The Author Email: Yuting Chai (yutingchai@gmail.com)