Researching | Physics-informed neural networks for diffraction tomography

Advanced Photonics, Volume. 4, Issue 6, 066001(2022)

Physics-informed neural networks for diffraction tomography On the Cover

Amirhossein Saba^*, Carlo Gigli^1、†, Ahmed B. Ayoub, and Demetri Psaltis

Author Affiliations

École Polytechnique Fédérale de Lausanne, Optics Laboratory, Lausanne, Switzerland

show less

Full Text Get PDF

Figures&Tables (9)

References (34)

Paper Information

Equations(8)

L_{P h} = \sum_{r} \frac{1}{N} {‖ [\nabla^{2} + k_{0}^{2} n^{2} (r)] U^{s} + k_{0}^{2} [n^{2} (r) - n_{0}^{2}] U^{i} ‖}^{2},

(1)

View in Article

w \to w - γ_{Ph} \frac{\partial L_{Ph}}{\partial w} .

(2)

View in Article

L_{D} = \sum_{i = 1}^{L} \frac{1}{L} {‖ U^{s} (R_{i} {n}) - U_{i}^{m} ‖}^{2} + R eg {n, U^{s} (n)},

(3)

View in Article

n \to n - γ_{D} \frac{\partial L_{D}}{\partial n} .

(4)

View in Article

R_{TV} (n) = \sum_{r} \sqrt{{| \nabla_{x} n (r) |}^{2} + {| \nabla_{y} n (r) |}^{2} + {| \nabla_{z} n (r) |}^{2}},

(5a)

View in Article

R_{NN} (n) = \sum_{r} \min {[n (r) - n_{0}, 0]}^{2} .

(5b)

View in Article

Error = \frac{\int {‖ U_{MaxwellNet} (r) - U_{COMSOL} (r) ‖}^{2} d r}{\int {‖ U_{COMSOL} (r) ‖}^{2} d r},

(6)

View in Article

\frac{\partial U^{s}}{\partial x} = \frac{U^{s} ((i + 1) Δ x, j Δ y, k Δ z) - U^{s} ((i - 1) Δ x, j Δ y, k Δ z)}{2 Δ x},

(7)

View in Article

Tools

Get Citation

Copy Citation Text

Amirhossein Saba, Carlo Gigli, Ahmed B. Ayoub, Demetri Psaltis. Physics-informed neural networks for diffraction tomography[J]. Advanced Photonics, 2022, 4(6): 066001

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Research Articles

Received: Jul. 9, 2022

Accepted: Oct. 27, 2022

Posted: Oct. 27, 2022

Published Online: Nov. 25, 2022

The Author Email: Saba Amirhossein (amirhossein.sabashirvan@epfl.ch)

DOI:10.1117/1.AP.4.6.066001

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology