Microstructure regulation and failure mechanism study of BaTiO<sub>3</sub>-based dielectrics for MLCC application

Yan Gu; Faqiang Zhang; Wanghua Wu; Zhifu Liu

doi:10.1142/S2010135X23500029

Journal of Advanced Dielectrics, Volume. 13, Issue 2, 2350002(2023)

Microstructure regulation and failure mechanism study of BaTiO₃-based dielectrics for MLCC application

Yan Gu^*, Faqiang Zhang^aff***, Wanghua Wu^*, and Zhifu Liu^aff******

CAS Key Lab of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, P. R. China

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Most widely used dielectrics for MLCC are based on BaTiO₃ composition which inevitably shows performance degradation during the application due to the migration of oxygen vacancies ( $V_{o}^{\cdot \cdot}$ ). Here, the BaTiO₃, ( ${Ba}_{0.97}$ ${Ca}_{0.03}$ )TiO₃, Ba( ${Ti}_{0.98}$ ${Mg}_{0.02}$ )O₃, ( ${Ba}_{0.97}$ ${Ca}_{0.03}$ )( ${Ti}_{0.98}$ ${Mg}_{0.02}$ )O₃, ( ${Ba}_{0.96}$ ${Ca}_{0.03}$ ${Dy}_{0.01}$ )( ${Ti}_{0.98}$ ${Mg}_{0.02}$ )O₃ ceramics (denoted as BT, BCT, BTM, BCTM and BCDTM, respectively) were prepared by a solid-state reaction method. The core-shell structured grains ( $\sim$ 200 nm) featured with 10-20 nm wide shell were observed and contributed to the relatively flat dielectric constant-temperature spectra of BTM, BCTM and BCDTM ceramics. The TSDC study found that the single/ mix doping of Ca $^{2 +}$ , especially the Mg $^{2 +}$ , Mg $^{2 +}$ /Ca $^{2 +}$ and Mg $^{2 +}$ /Ca $^{2 +}$ /Dy $^{3 +}$ could limit the emergence of $V_{o}^{\cdot \cdot}$ during the sintering and suppress its long-range migration under the electric-field. Because of this, the highly accelerated lifetimes of the ceramics were increased and the value of BCDTM is 377 times higher than that of BT ceramics. The $p - n$ junction model was built to explain the correlation mechanism between the long-range migration of $V_{o}^{\cdot \cdot}$ and the significantly increased leakage current of BT-based dielectrics in the late stage of HALT.

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Yan Gu, Faqiang Zhang, Wanghua Wu, Zhifu Liu. Microstructure regulation and failure mechanism study of BaTiO₃-based dielectrics for MLCC application[J]. Journal of Advanced Dielectrics, 2023, 13(2): 2350002

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Paper Information

Category: Research Articles

Received: Oct. 25, 2022

Accepted: Dec. 9, 2022

Published Online: Jun. 16, 2023

The Author Email: Gu Yan (zhangfq@mail.sic.ac.cn), Zhang Faqiang (zhangfq@mail.sic.ac.cn), Wu Wanghua (zhangfq@mail.sic.ac.cn), Liu Zhifu (liuzf@mail.sic.ac.cn)

DOI:10.1142/S2010135X23500029

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology