Laser & Optoelectronics Progress, Volume. 55, Issue 7, 71012(2018)

Single Sample Face Recognition Based on Improved Center-Symmetric Local Binary Pattern and Bit-Plane Decomposition

Yang Huixian1,2, Zhang Fei1、*, Chen Yong1, Liu Jian1, and Zhou Tongtong2
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  • 1[in Chinese]
  • 2[in Chinese]
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    To overcome the problem of poor recognition of traditional face recognition algorithms in single sample environment, a single sample face recognition algorithm combining improved center-symmetric local binary pattern and bit-plane decomposition (ICSDBP) is proposed. Firstly, the texture feature of a face image is extracted by the improved center-symmetric local binary pattern operator to obtain two texture feature images with different radii, and then each texture feature image is decomposed into 4 bit-plane images. Finally, eight feature images are combined in series, and the nearest neighbor classifier is used for classification and recognition. The simulation results on the AR, CAS-PEAL and Extend Yale B face databases show that the proposed algorithm has high recognition rate and high recognition speed, and it is robust to the variations of face illumination and face expression.

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    Yang Huixian, Zhang Fei, Chen Yong, Liu Jian, Zhou Tongtong. Single Sample Face Recognition Based on Improved Center-Symmetric Local Binary Pattern and Bit-Plane Decomposition[J]. Laser & Optoelectronics Progress, 2018, 55(7): 71012

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    Paper Information

    Category: Image Processing

    Received: Jan. 2, 2018

    Accepted: --

    Published Online: Jul. 20, 2018

    The Author Email: Fei Zhang (771935992@qq.com)

    DOI:10.3788/lop55.071012

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