Laser & Optoelectronics Progress, Volume. 55, Issue 7, 71012(2018)
Single Sample Face Recognition Based on Improved Center-Symmetric Local Binary Pattern and Bit-Plane Decomposition
To overcome the problem of poor recognition of traditional face recognition algorithms in single sample environment, a single sample face recognition algorithm combining improved center-symmetric local binary pattern and bit-plane decomposition (ICSDBP) is proposed. Firstly, the texture feature of a face image is extracted by the improved center-symmetric local binary pattern operator to obtain two texture feature images with different radii, and then each texture feature image is decomposed into 4 bit-plane images. Finally, eight feature images are combined in series, and the nearest neighbor classifier is used for classification and recognition. The simulation results on the AR, CAS-PEAL and Extend Yale B face databases show that the proposed algorithm has high recognition rate and high recognition speed, and it is robust to the variations of face illumination and face expression.
Get Citation
Copy Citation Text
Yang Huixian, Zhang Fei, Chen Yong, Liu Jian, Zhou Tongtong. Single Sample Face Recognition Based on Improved Center-Symmetric Local Binary Pattern and Bit-Plane Decomposition[J]. Laser & Optoelectronics Progress, 2018, 55(7): 71012
Category: Image Processing
Received: Jan. 2, 2018
Accepted: --
Published Online: Jul. 20, 2018
The Author Email: Fei Zhang (771935992@qq.com)