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Infrared and Laser Engineering, Volume. 35, Issue 3, 289(2006)

Reliability of long-wavelength PC HgCdTe IR detectors

[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Reliability of long-wavelength PC HgCdTe IR detectors[J]. Infrared and Laser Engineering, 2006, 35(3): 289

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    Paper Information

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    Received: Aug. 30, 2005

    Accepted: Oct. 10, 2005

    Published Online: Oct. 20, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology