Laser & Optoelectronics Progress, Volume. 59, Issue 5, 0524002(2022)
Phase Distribution of Laguerre-Gaussian Beams on a Layered Topological Insulator Dielectric Film
Herein, the phase distribution characteristics of Laguerre-Gaussian (LG) beams incident on a layered topological insulator (TI) thin film are studied using the plane angular spectrum expansion method and transmission matrix theory. Numerical results show that the phase structure of LG beams in the reflected and transmitted fields is affected by the changes in topological magneto-electric polarizability. Particularly, the center axis of the phase distribution of p-wave shifts left or right. This research on the phase distribution characteristics of LG beams incident on layered topological insulator thin films has significance in wireless laser communication, optical trapping, particle manipulation, nonlinear optics, information coding, and other fields.
Get Citation
Copy Citation Text
Hui Meng, Mingjun Wang, Duo Ning, Shenhe Ren. Phase Distribution of Laguerre-Gaussian Beams on a Layered Topological Insulator Dielectric Film[J]. Laser & Optoelectronics Progress, 2022, 59(5): 0524002
Category: Optics at Surfaces
Received: Mar. 2, 2021
Accepted: Jun. 10, 2021
Published Online: Feb. 22, 2022
The Author Email: Wang Mingjun (rshyjs@163.com)