Study of SrS (Eu,Sm) Electron-Trapping Thin Film Used in Optical Storage and Information Processing

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 18, Issue 8, 1149(1998)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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The properties of SrS(Eu, Sm) electron-trapping thin film grown by elctron beam evaporation are studied. The X-ray diffraction pattern, microstructure measuered by atomic force microscopy, optical spectra and the stored image are presented. The results show that the electron-trapping thin film has good optical properties and can be used in optical storage and information processing.

Keywords

electron beam evaporation optical information processing optical storage electron-trapping thin film

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of SrS (Eu,Sm) Electron-Trapping Thin Film Used in Optical Storage and Information Processing[J]. Acta Optica Sinica, 1998, 18(8): 1149

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Paper Information

Category: Rapid communications

Received: Jun. 26, 1997

Accepted: --

Published Online: Oct. 18, 2006

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DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology