Laser & Optoelectronics Progress, Volume. 60, Issue 20, 2018001(2023)

Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network

Yi Wang1,2, Xiaoyu Wei1、*, Baohui Liu1, and Hao Su1,3
Author Affiliations
  • 1College of Electrical Engineering, North China University of Science and Technology, Tangshan 063210, Hebei , China
  • 2Tangshan Technology Innovation Center of Intellectualisation of Metal Component Production Line, Tangshan 063210, Hebei , China
  • 3Tangshan Key Laboratory of Semiconductor Integrated Circuits, Tangshan 063210, Hebei , China
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    Fourier ptychography microscopy (FPM) is limited by hardware and algorithm, and its overall performance needs to be improved. To address the issues of slow imaging speed and low imaging quality of traditional FPM technology, the FPM image reconstruction approach integrated with depth learning has been widely explored. Herein, based on this, a super-resolution countermeasure generation network-based FPM model is proposed. Furthermore, global feature fusion is obtained by adding dense block connections using the original network, and a weighted loss function is used to enhance the quality of image reconstruction. The reconstruction results of the resolution plate image demonstrate that the proposed depth learning method has a better reconstruction effect and faster reconstruction speed than the conventional method.

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    Yi Wang, Xiaoyu Wei, Baohui Liu, Hao Su. Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network[J]. Laser & Optoelectronics Progress, 2023, 60(20): 2018001

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    Paper Information

    Category: Microscopy

    Received: Oct. 26, 2022

    Accepted: Dec. 23, 2022

    Published Online: Oct. 13, 2023

    The Author Email: Wei Xiaoyu (1347870676@qq.com)

    DOI:10.3788/LOP222900

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