Chinese Optics Letters, Volume. 2, Issue 11, 11640(2004)

Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

Yuanhong Yang* and Hongtao Yu
Author Affiliations
  • The Institute of Optoelectronics Technology, Beijing University of Aeronautics and Astronautics, Beijing 100083
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    A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.

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    Yuanhong Yang, Hongtao Yu. Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit[J]. Chinese Optics Letters, 2004, 2(11): 11640

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Jun. 18, 2004

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Yuanhong Yang (yhyang@263.net.cn)

    DOI:

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