Chinese Optics Letters, Volume. 4, Issue 11, 675(2006)
Symmetrical periods used as matching layers in multilayer thin film design
Properties of symmetrical layers as matching layers in multilayer thin film design were analyzed. A calculation method was presented to derive parameters of desired equivalent refractive index. A harmonic beam splitter was designed and fabricated to test this matching method.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Symmetrical periods used as matching layers in multilayer thin film design[J]. Chinese Optics Letters, 2006, 4(11): 675
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