Laser & Optoelectronics Progress, Volume. 57, Issue 3, 031202(2020)

Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry

Zhongsheng Zhai1、*, Jiaojie Huang1, Hang Zhao1, Jinsong Li1, Qinghua Lü2, and Xuanze Wang1
Author Affiliations
  • 1Hubei Key Laboratory of Modern Manufacturing Quantity Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan, Hubei 430068, China
  • 2School of Science, Hubei University of Technology, Wuhan, Hubei 430068, China
  • show less

    This study presents a method for controlling the intensity consistency of multi-wavelength micro-interferometry. A white LED with tunable intensity is used as the multi-wavelength source. A detector is placed in the micro-interferometry optical path to detect intensity of light emitted from different filters, and the signal is fed back to an STM32 microcontroller in real time. Light intensities from different optical filters are quickly adjusted to be consistent using PID (proportion integration differentiation) control method and multi-wavelength interferograms with consistent gray distribution are obtained. The experimental results show that the presented method can quickly adjust the illumination intensity at different wavelengths, accurately stabilize at the set value, and reduce interferogram contrast error from 18% to 2%.

    Tools

    Get Citation

    Copy Citation Text

    Zhongsheng Zhai, Jiaojie Huang, Hang Zhao, Jinsong Li, Qinghua Lü, Xuanze Wang. Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031202

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 13, 2019

    Accepted: Jul. 27, 2019

    Published Online: Feb. 17, 2020

    The Author Email: Zhai Zhongsheng (supersakula@163.com)

    DOI:10.3788/LOP57.031202

    Topics