High Power Laser Science and Engineering, Volume. , Issue , ()

X-ray polarimetry and its application to strong-field QED [Early Posting]

Yu Qiqi, Xu Dirui, Shen Baifei, Cowan Thomas, Schlenviogt Hans-Peter
Author Affiliations
  • Helmholtz-Zentrum Dresden-Rossendorf
  • Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences
  • Shanghai Normal University
  • Technische Universität Dresden
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    Polarimetry is a highly sensitive method to quantify changes of the polarization state of light when passing through matter and is therefore widely applied in material science. The progress of synchrotron and X-Ray Free Electron Laser (XFEL) sources has led to significant developments of X-ray polarizers, opening perspectives for new applications of polarimetry to study source and beamline parameters as well as sample characteristics. X-ray polarimetry has shown to date a polarization purity of <1.4e-11, enabling detection of very small signals from ultrafast phenomena. A prominent application is the detection of vacuum birefringence. Vacuum birefringence is predicted in Quantum Electrodynamics (QED) and expected to be probed by combining an XFEL with a petawatt-class optical laser. We review how source and optical elements affect X-ray polarimeters in general and what qualities are required for detection of vacuum birefringence.

    Paper Information

    Manuscript Accepted: Apr. 6, 2023

    Posted: May. 23, 2023

    DOI: HPL-0028